Schottky Barrier Heights of the YbSi/Si and YbGe/Ge Contacts: A Density-functional Study

碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 103 === The carrier mobility of Ge is higher than that of Si. Such a semiconductor will very likely be the next-generation channel material to replace Si as the traditional Si-based MOSFET is approaching its scaling limit. This new development promises to...

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Bibliographic Details
Main Authors: Lin, Ting-Hsu, 林庭煦
Other Authors: Lin, Chiung-Yuan
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/45247096671992199868