Defect-Oriented Test-Generation Flow for Industrial Cases
碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 103 === As the modern ICs are facing increasingly tougher DPPM requirements, and the insufficient of the traditional fault model in testing intra-cell defects, new testing techniques such as Gate-Exhaustive, N-Detect, or Cell-aware were proposed. Though the fault c...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/pm7xzx |