Fault Models and Test Methodologies for Advanced Embedded Memories: Industrial Case Study
博士 === 國立交通大學 === 電子工程學系 電子研究所 === 103 === As the technology still shrinking, the fabricated quality is much harder to control than before. Therefore, more and more hard defects and more severe process variation are observed in the silicon. These challenges influence the designers and testers in diffe...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/8r68xy |