Effects of hygrothermal deformation of polarizer components on light leakage in thin-film transistor liquid-crystal displays
博士 === 國立交通大學 === 材料科學與工程學系所 === 103 === In this study, we combine the stress measurement using bending beam technique with static thermal-dependent and transient time-dependent three-dimensional (3D) finite element analysis (FEA) analysis to examine the light leakage variation of the thin-film tran...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/92289089306390918978 |