Interface Improvements of a-InGaZnO TFTs by Introducing a Double Active Layer Structure

碩士 === 國立交通大學 === 光電工程研究所 === 103 === a-IGZO has been demonstrated successfully as the active layer in TFTs, but the electrical reliability of a-IGZO TFTs still have some issues needs to be concerned. The method about reducing interface defect of a-IGZO TFTs have rarely been reported. Therefore, a d...

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Bibliographic Details
Main Authors: Chan, Feng-Jui, 詹豐瑞
Other Authors: Shieh, Han-Ping
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/15468614840193845534