Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics

博士 === 國立成功大學 === 微電子工程研究所 === 103

Bibliographic Details
Main Authors:	Bo-YiChou, 周伯羿
Other Authors:	Wei-Chou Hsu
Format:	Others
Language:	en_US
Published:	2015
Online Access:	http://ndltd.ncl.edu.tw/handle/42468990081554721100

id	ndltd-TW-103NCKU5428066
record_format	oai_dc
spelling	ndltd-TW-103NCKU54280662016-05-22T04:44:49Z http://ndltd.ncl.edu.tw/handle/42468990081554721100 Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics 高介電材料於氮化鋁鎵/氮化鎵高電子移動率電晶體之可靠度研究 Bo-YiChou 周伯羿博士國立成功大學微電子工程研究所 103 Wei-Chou Hsu 許渭州 2015 學位論文 ; thesis 98 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	博士 === 國立成功大學 === 微電子工程研究所 === 103
author2	Wei-Chou Hsu
author_facet	Wei-Chou Hsu Bo-YiChou 周伯羿
author	Bo-YiChou 周伯羿
spellingShingle	Bo-YiChou 周伯羿 Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
author_sort	Bo-YiChou
title	Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
title_short	Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
title_full	Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
title_fullStr	Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
title_full_unstemmed	Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics
title_sort	reliability studies of algan/gan hemts with high-k dielectrics
publishDate	2015
url	http://ndltd.ncl.edu.tw/handle/42468990081554721100
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Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics

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