Reliability Studies of AlGaN/GaN HEMTs with High-k Dielectrics

博士 === 國立成功大學 === 微電子工程研究所 === 103

Bibliographic Details
Main Authors: Bo-YiChou, 周伯羿
Other Authors: Wei-Chou Hsu
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/42468990081554721100