A Novel Side-Channel Attack on Secured Scan Chains
碩士 === 國立中興大學 === 資訊科學與工程學系 === 103 === Scan chains solve the test problem in modern VLSI by providing observability and controllability to sequential elements. On the flip side, the scan chain also becomes a back door for reverseengineering attack and can be used to glean secrete information. In or...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/36710664017859248822 |