Electrical performance and micro-loading effect of n-type FinFETs with temperature stress

碩士 === 明新科技大學 === 電子工程系碩士班 === 103 === For the traditional CMOS transistors with planar form, these devices have been applied for a long time in semiconductor industry. Due to the need of the IC marketing, the shrinkage of device feature is a major trend, but the process development also faces lots...

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Bibliographic Details
Main Authors: Jian- Liang Lin, 林建良
Other Authors: Mu-Chun Wang
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/85964889347772986410

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