Low-Frequency Noise Analysis of CMOS -Compatible Material for Microbolometer
碩士 === 國立高雄應用科技大學 === 光電與通訊工程研究所 === 103 === The purposes of this study are to set up a noise measurement system, measure and quantitatively analyze the noises of CMOS-compatible microbolometer materials. In this work, the test samples of polysilicon and titanium silicide with different process cond...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/62xpvc |