The Effect of Argon Plasma Activation on the Die-Shear Force and Reliability of Chips and Flex Substrates Assembly Using a Non-conductive Film
碩士 === 中山醫學大學 === 職業安全衛生學系碩士班 === 103 === A non-conductive film (NCF) and the thermal compression bonding process were combined to assemble chips and flex substrates. Two purposes of this study are expected to achieve chips bonded on flex substrates directly and to verify the reliability of chips an...
Main Authors: | Jun-you Chen, 陳俊佑 |
---|---|
Other Authors: | 莊正利 |
Format: | Others |
Language: | zh-TW |
Published: |
2015
|
Online Access: | http://ndltd.ncl.edu.tw/handle/92477356133412461509 |
Similar Items
-
Increasing the bond strength and reliability of chips and flex substrates assembly with non-conductive paste by surface activated technology
by: Yi-Rong Jiang, et al.
Published: (2015) -
Study on the Reliability of Thermosonic Flip Chip Bonding of Chips with Copper Interconnects on Flex Substrates
by: Wei-hao chan, et al.
Published: (2008) -
Correlation Between the Viscoelastic Properties of Anisotropic Conductive Adhesive and Reliability of Chip-on-Flex
by: Chen, Yi-Lin, et al.
Published: (2009) -
Mechanical properties and reliability test of anisotropic conductive film in flip-chip-on-flex packaging
by: Chien-Yuan Huang, et al.
Published: (2006) -
Study on the Bonding Strength of Thermosonic Flip Chip Bonding on Flex Substrates after Reliability tests
by: Kang Minyi, et al.
Published: (2011)