| Summary: | 碩士 === 中華大學 === 資訊工程學系碩士班 === 103 === It is well known that DRAM(Dynamic Random Access Memory) has been applied in most of electronic products. From the viewpoint of manufacture cost, DRAM has a structural advantage to store each bit of data per memory cell by only using one transistor and one capacitor. The 1T1C structure in DRAM leads to the benefit of high density and low cost. However, DRAM is one kind of volatile memories. Even as power is not off, the voltage inside the capacitor is gradually reduced such that the data in the capacitor is lost.
Basically, manufacture cost in DRAM consists of wafer cost, packaging cost and testing cost. The testing cost seriously depends on the testing speed. DRAM testing becomes more and more important because of the feature of the high density and the complexity of the advance process in DRAM chips. The ADVANTEST T5585 is a general-purpose, high-performance and high-speed DRAM testing platform. In general, the standard flow in ADVANTEST T5585 must take a long time to complete DRAM testing. In this thesis, a channel-sharing-based modification design in a DRAM testing platform is proposed to improve the testing speed during traditional testing flow.
March-X algorithm is one of the most popular testing algorithms employed currently for detecting functional faults in DRAM testing. In the experiment, we use March X running in ADVANTEST T5585. The experimental results show that the proposed channel-sharing-based modification design with March-X algorithm can reduce 25% of the total testing time with the same testing quality.
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