Parasitic-aware Common-centroid Binary-weighted Capacitor Layout Generation with Integrated Sizing, Placement, Routing and Shielding Techniques

碩士 === 國立中正大學 === 電機工程研究所 === 103 === Capacitor sizing is a crucial step when designing a charge-scaling digital-to-analog converter. Larger capacitor size can achieve better circuit accuracy and performance due to less impact from random, systematic, and parasitic mismatch. However, it also results...

Full description

Bibliographic Details
Main Authors: Chun-Yu Lin, 林俊佑
Other Authors: Mark Po-Hung Lin
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/pqnzpc
Description
Summary:碩士 === 國立中正大學 === 電機工程研究所 === 103 === Capacitor sizing is a crucial step when designing a charge-scaling digital-to-analog converter. Larger capacitor size can achieve better circuit accuracy and performance due to less impact from random, systematic, and parasitic mismatch. However, it also results in a larger chip area and even more power consumption. In addition to minimizing random and systematic mismatch during common-centroid capacitor placement, [Lin et. al., DAC’14][1] presents the first problem formulation in the literature which simultaneously considers capacitor sizing and parasitic matching during common-centroid capacitor layout generation such that the power consumption is minimized while the circuit accuracy/performance is also satisfied. Based on the problem formulation and approach, we present the shielding technique to improve the [1]'s approach. The experimental result shows our approach can achieve a smaller chip area and lower power reduction compared with the state of the art.