Machine Vision Based on in-line Surface defect inspection system

碩士 === 國立雲林科技大學 === 機械工程系 === 102 === This paper is based on capturing images according to the different defects in the specimen, as well as inspection defects and frequency domains by using a CCD camera along with a machine vision algorithm and designs a lighting system. The inspection method first...

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Bibliographic Details
Main Authors: Po-Chih Chen, 陳柏岐
Other Authors: Chao-Ching Ho
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/67371246918919316914