Machine Vision Based on in-line Surface defect inspection system
碩士 === 國立雲林科技大學 === 機械工程系 === 102 === This paper is based on capturing images according to the different defects in the specimen, as well as inspection defects and frequency domains by using a CCD camera along with a machine vision algorithm and designs a lighting system. The inspection method first...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2014
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Online Access: | http://ndltd.ncl.edu.tw/handle/67371246918919316914 |