Fabrication of A Novel Intelligent Probe Card
碩士 === 國立臺北科技大學 === 機電整合研究所 === 102 === The development of high-frequency components has been continually pushing area-reduction in the semiconductor manufacturing process. The wafer probe card is a kind of tool for rapid detection and assurance of yield rate. However, how to make an effective low-c...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/gg7sh2 |