The Prototype of Full-field Reflection-type of Angle Deviation Microscope
碩士 === 國立虎尾科技大學 === 光電與材料科技研究所 === 102 === This project is aimed to change the previous planar framework of the non-scanning, non-contact, non-interferometric, reflection-type of biaxial angle deviation three-dimensional microscope to a refined three-dimensional framework. The test framework uses gr...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/wbgwb5 |