The Investigation of Reliability for N-Channel FinFET in Positive Bias Temperature Instability and Hot-Carrier Stress
碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日106.07.30
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/76898286751144216583 |