Surface Passivation of Germanium Wafers using Hydrogenated Amorphous Silicon Layers

碩士 === 國立臺灣科技大學 === 化學工程系 === 102 === In this paper, we studied several important issues concerning fabrication of crystalline germanium (Ge) hetero-junction using amorphous Si as the passivation layers. First of all, surface cleaning procedure of Ge wafers was established through a comparison with...

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Bibliographic Details
Main Authors: Ken-Hsuan Lee, 李耿亘
Other Authors: Lu-Sheng Hong
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/66857266560171042056