A Variability Regression Model for Failure Path Prediction
碩士 === 國立清華大學 === 電機工程學系 === 102 === As the CMOS technology coming to nanometer scale, process variation play an important role in yield of production. It and defects can reduce a product’s parametric yield. Yet, even we have categorized chips with above influences, there is a lack of methods to fur...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/01618798618667761191 |