Development of 4H-SiC Bipolar Devices

碩士 === 國立清華大學 === 電子工程研究所 === 102 === The thesis reports the design and fabrication of 4H-SiC bipolar devices including p-i-n diodes and bipolar junction transistors. Conventional 4H-SiC p-i-n diodes suffers from a reliability problem called bipolar degradation. It is believed that the recombination...

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Bibliographic Details
Main Authors: Chao, Li-Chiang, 趙力強
Other Authors: Huang, Chih-Fang
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/mrde8d