Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption

碩士 === 國立東華大學 === 電機工程學系 === 102 === As the feature size of chips shrinks with semiconductor technology advancing, the size of transistors and their operating voltage keep decreasing. One of the major problems with advanced semiconductor technology is timing errors caused by process variation and de...

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Main Authors: Tsung-Han Wu, 吳宗翰
Other Authors: Hsin-Chou Chi
Format: Others
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/p868td
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spelling ndltd-TW-102NDHU54420332019-05-15T21:32:18Z http://ndltd.ncl.edu.tw/handle/p868td Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption RSA加解密演算法之時序容錯超大型積體電路設計 Tsung-Han Wu 吳宗翰 碩士 國立東華大學 電機工程學系 102 As the feature size of chips shrinks with semiconductor technology advancing, the size of transistors and their operating voltage keep decreasing. One of the major problems with advanced semiconductor technology is timing errors caused by process variation and device aging. With such problems, conventional worst-case designs suffer poor system performance. This thesis proposes an aggressive design technique for VLSI circuits for RSA encryption and decryption for tolerating timing errors. We have developed a methodology of designing reconfigurable VLSI circuits for RSA encryption and decryption that can tolerate timing errors. The reconfigurable VLSI circuits for RSA encryption and decryption are resilient to any timing errors occurring at any stage and any time. When the timing error occurs, the system reconfigures the buffer cells of VLSI circuits for RSA encryption and decryption with little performance degradation. We have applied our technique to the VLSI circuits for RSA encryption and decryption designs. The implementation results show that our proposed designs achieve tolerance of timing errors with reasonable cost. Hsin-Chou Chi 紀新洲 2014 學位論文 ; thesis 76
collection NDLTD
format Others
sources NDLTD
description 碩士 === 國立東華大學 === 電機工程學系 === 102 === As the feature size of chips shrinks with semiconductor technology advancing, the size of transistors and their operating voltage keep decreasing. One of the major problems with advanced semiconductor technology is timing errors caused by process variation and device aging. With such problems, conventional worst-case designs suffer poor system performance. This thesis proposes an aggressive design technique for VLSI circuits for RSA encryption and decryption for tolerating timing errors. We have developed a methodology of designing reconfigurable VLSI circuits for RSA encryption and decryption that can tolerate timing errors. The reconfigurable VLSI circuits for RSA encryption and decryption are resilient to any timing errors occurring at any stage and any time. When the timing error occurs, the system reconfigures the buffer cells of VLSI circuits for RSA encryption and decryption with little performance degradation. We have applied our technique to the VLSI circuits for RSA encryption and decryption designs. The implementation results show that our proposed designs achieve tolerance of timing errors with reasonable cost.
author2 Hsin-Chou Chi
author_facet Hsin-Chou Chi
Tsung-Han Wu
吳宗翰
author Tsung-Han Wu
吳宗翰
spellingShingle Tsung-Han Wu
吳宗翰
Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
author_sort Tsung-Han Wu
title Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
title_short Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
title_full Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
title_fullStr Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
title_full_unstemmed Design of Timing-Error-Tolerant VLSI Circuits for RSA Encryption and Decryption
title_sort design of timing-error-tolerant vlsi circuits for rsa encryption and decryption
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/p868td
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