850-nm Si Avalanche Photodiodes in Standard CMOS Technology with Back-end Process

碩士 === 國立中央大學 === 電機工程學系 === 102 === This study presents lateral avalanche photodetectors (APDs) implemented in standard 0.18 µm CMOS technology operating at 850-nm wavelength. In order to reduce the slow diffusion carriers generated within the Si substrate, it is necessary to utilize simple back-en...

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Bibliographic Details
Main Authors: Chih-Ai Huang, 黃智愛
Other Authors: Yue-ming Hsin
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/84472209886057899199