Step-Stress Accelerated Life Tests of Series Systems with Interval Data Under Exponential Lifetime Distributions
碩士 === 國立中央大學 === 統計研究所 === 102 === High reliability products have longer lifetime under normal environment. Accelerated life tests are usually used to reduce the experiment time. In a series system, the system fails when any of the components fails, while the cause of system failure may not be obse...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/78997803927014708140 |