A universal parametric robust approach for analyzing count data from cross over designs
碩士 === 國立中央大學 === 統計研究所 === 102 === The aim of this dissertation is to show that the bivariate negative binomial distribution, when properly adjusted, is a convenient tool for analyzing count data from cross over designs. We contrast this universal parametric robust with a currently proposed method...
Main Authors: | Yi-chun Hou, 侯宜君 |
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Other Authors: | 鄒宗山 |
Format: | Others |
Language: | zh-TW |
Published: |
2014
|
Online Access: | http://ndltd.ncl.edu.tw/handle/z6js74 |
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