A universal parametric robust approach for analyzing count data from cross over designs

碩士 === 國立中央大學 === 統計研究所 === 102 === The aim of this dissertation is to show that the bivariate negative binomial distribution, when properly adjusted, is a convenient tool for analyzing count data from cross over designs. We contrast this universal parametric robust with a currently proposed method...

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Bibliographic Details
Main Authors: Yi-chun Hou, 侯宜君
Other Authors: 鄒宗山
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/z6js74