Performance Investigation of VOx Doped Tantalum in Microbolometers

碩士 === 國立成功大學 === 光電科學與工程學系 === 102 === In this study, the tantalum (Ta) was used to dope into the VOx films. The VOx films with various Ta-doped contents were fabricated by magnetron radio frequency (RF) co-sputtering system. The TCR values of Ta-V-O thin films were obtained by four point probe mea...

Full description

Bibliographic Details
Main Authors: Chia-LingWu, 吳嘉玲
Other Authors: Hsin-Ying Lee
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/15265069095863481561