Local Anodic Oxidation by Atomic Force Microscope Probe Developed for Graphene Nanodevice
碩士 === 國立成功大學 === 物理學系 === 102 === In this study, local anodic oxidation (LAO) of graphene on SiC substrates is carried out using atomic force microscope (AFM). From Raman spectroscopy and photoelectron spectroscopy (PES), LAO regions of graphene on SiC substrates with and without buffer layer (i.e....
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/y2f63z |