Oxidation Suppression of SOFC Metallic Interconnect using Conducting Oxide Protection Layer

碩士 === 國立成功大學 === 材料科學及工程學系 === 102 === Since oxide layer composed of Cr2O3 and MnCr2O4 with high resistance formed on surface of interconnect Crofer 22 H at SOFC operating temperature, it is necessary to deposit highly conductive oxide layer to reduce the oxidation rate of substrate. In this study,...

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Bibliographic Details
Main Authors: Hsin-ChiaHo, 何欣家
Other Authors: Kuan-Zong Fung
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/grzpmw