Discussion of the Failure at the Conducting Layer for Direct Chip Attach Package

碩士 === 國立成功大學 === 工程科學系 === 102 === In recent years, with the continuous progress and innovation of the electronic products progress, the requirements for frivolous short, high frequency, high speed and the high heat emission to the IC chip has increased. As a result, the flip chip and some similar...

Full description

Bibliographic Details
Main Authors: Po-YuanHsiao, 蕭博元
Other Authors: Rong-Sheng Chen
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/47329231332951484870