TFT-LCD BM Defect Inspection Parameter Design by Using Taguchi Method
碩士 === 中興大學 === 電機工程學系所 === 102 === This research is on possible improvement of the auto optical inspection machine for TFT-LCD black matrix defect inspection. An orthogonal array of the control parameters is constructed according to the Taguchi method for experimental design. The quality characteri...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/45952653358948349148 |