Design and Fabrication of Uniform Temperature Chamber for Integrated Circuits Testing Application
碩士 === 國立中興大學 === 機械工程學系所 === 102 === The study develops the uniform temperature of handler chamber for the IC (integrated circuits) testing system. The region temperature far away from the heat point in the original IC testing chamber is much lower, and the temperature difference is at least 10 °C...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25243110748062729429 |