Using International Patent Litigation as Examples to Evaluate Taiwan High Tech Industry Patent Quality

• Main Authors: Chen, Yi Ting, 陳怡婷
• Other Authors: Chan, Keith
• Format: Others
• Language: zh-TW
• Online Access: http://ndltd.ncl.edu.tw/handle/66747096909827278250

碩士 === 國立政治大學 === 科技管理與智慧財產研究所 === 102