Using International Patent Litigation as Examples to Evaluate Taiwan High Tech Industry Patent Quality

碩士 === 國立政治大學 === 科技管理與智慧財產研究所 === 102

Bibliographic Details
Main Authors: Chen, Yi Ting, 陳怡婷
Other Authors: Chan, Keith
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/66747096909827278250