Early Effect Exposing Performance of 28nm HK/MG pMOSFETs under PDA or DPN Nitridation Treatment

碩士 === 明新科技大學 === 電子工程研究所 === 102 === With the advancement of technology, the feature size of field-effect transistors coming from semiconductor manufacturing process technology has evolved from sub-micron to 28nm process generation or beyond. Following the Moore’s law, besides the reduction of proc...

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Bibliographic Details
Main Authors: Po-Kai Chen, 陳柏愷
Other Authors: Fang Hsu
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/42352509086727995648