Dynamic Trigger Scheduling System for Wafer Probing

碩士 === 逢甲大學 === 工業工程與系統管理學系 === 102 === Wafer Probing, known as Wafer Sort, is an important process which verifies the wafer yield after wafer fabrication in the semiconductor industry. A major feature of the semiconductor industry is its relatively high investment in equipment cost, about 2/3 of to...

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Bibliographic Details
Main Authors: LAI XIN NAN, 賴欣男
Other Authors: 王逸琦
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/69380491607132508394