Applying Kappa analysis method for attritube measurement system-a case study of a semiconductor foundry

碩士 === 中華大學 === 資訊管理學系碩士班 === 102 === As nanotechnology has become a tendency for the semiconductor industry in the 21st century, how to preserve the competitive advantage in the international market and meet the customer requirements for product quality is a challenge for the sustainability of an e...

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Bibliographic Details
Main Authors: Lin,Mei-Hua, 林美花
Other Authors: Wang, Wen-Liang
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/96761712352886951155