Screening of IC Silicon Wafer Manufacturing Parameter by Conducting MTS
碩士 === 中華大學 === 企業管理學系碩士班 === 102 === The lifecycle of electronic product becomes shorter in recent years, therefore, it is necessary to seek for a faster proactive test for semiconductor material to shorten the test lifecycle in order to achieve comprehensive production. As a consequence, it create...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/35826051201784355461 |