Back end anneal effect on negative bias temperature instability for PMOS in 30nm DRAM technology
碩士 === 長庚大學 === 電子工程學系 === 102
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/25883628199738499105 |