建立垂直式微型探針針測實驗與分析模型
碩士 === 國立中正大學 === 機械工程學系暨研究所 === 102 === A probe card, an interface between the probe tester and wafer, is extremely essential to the process of IC test. It’s usually composed of hundreds of probes set up in the specific position of probe tester which could make each die on the wafer aligned against...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/91050421988714881181 |