The Study of the Optimized Model Parameters of laser inIC Packages by Using Taguchi Method
碩士 === 國立雲林科技大學 === 工業工程與管理研究所碩士班 === 101 === Laser stamped in semiconductor packaging and testing process is an integral part of the process.Is intended for product labeling as Logo、Device/Product Name、Date Code、Lot Number and Other special features on the products of the mark. How to quickly find...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/03766562562259269863 |