Weight-Based Device Area Allocation for Close-to-Optimum INL-Based Yield in Integrated Circuits
碩士 === 國立臺灣科技大學 === 電子工程系 === 101 === In the past, analog integrated-circuit (IC) papers focused much less on the layout than design. Among those IC layout papers, most attention were paid to the layout patterns of critical devices to reduce the systematic mismatch for yield enhancement in analog in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/90134590578595996865 |