Atomic layer deposition of Al2O3 films on silicon wafers and their passivation property

碩士 === 國立臺灣科技大學 === 化學工程系 === 101 === Surface passivation and anti-reflection are important issues for silicon based solar cells. In this thesis, we deposited Al2O3 passivation films on silicon wafers using atomic layer deposition (ALD) technique. First of all, self-limiting growth region for Al2O3-...

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Bibliographic Details
Main Authors: GUO-HUA LIAU, 廖國樺
Other Authors: Lu-Sheng Hong
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/83771813305358570568