| Summary: | 碩士 === 國立臺灣大學 === 電子工程學研究所 === 101 === Testing TFT-LCD source driver ICs incurs growing manufacturing test cost as the trend of higher color depths and more output channels continues.
In this thesis, we develop an effective design-for-test(DfT) technique for short faults in the source driver IC digital-to-analog converters(DAC’s). By adding DfT multiplexers(DfT-MUX’s), the proposed technique detects the short faults by observing the voltage source current without having to probing all the output channels pins as the conventional approach does. Furthermore, by carefully placing the DfT-MUX’s, the short fault induced error current is maximized to improve observability.
Spice simulation results on a 8-bit source driver IC shows that, with the proposed DfT technique, all the modeled short faults can be easily detected by the significant increase in voltage source currents.
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