A DfT Technique for TFT-LCD Source Driver ICs
碩士 === 國立臺灣大學 === 電子工程學研究所 === 101 === Testing TFT-LCD source driver ICs incurs growing manufacturing test cost as the trend of higher color depths and more output channels continues. In this thesis, we develop an effective design-for-test(DfT) technique for short faults in the source driver IC digi...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/17283740215403148824 |