Chaotic and Nonlinear Dynamic Analysis of Atomic Force Microscope System
碩士 === 國立臺南大學 === 機電系統工程研究所碩士班 === 101 === Atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, which is an essential characterization and actuation tool in modern nanoscience or engineering. AFM is wildly apply for micro-electromechanical, optoelectronics, bioc...
Main Authors: | , |
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Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2013
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Online Access: | http://ndltd.ncl.edu.tw/handle/48077298988662829149 |