Chaotic and Nonlinear Dynamic Analysis of Atomic Force Microscope System

碩士 === 國立臺南大學 === 機電系統工程研究所碩士班 === 101 === Atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, which is an essential characterization and actuation tool in modern nanoscience or engineering. AFM is wildly apply for micro-electromechanical, optoelectronics, bioc...

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Bibliographic Details
Main Authors: Shin-xiang Hsu, 徐新翔
Other Authors: Chung-Neng Huang
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/48077298988662829149