Characterization of Ge MOSFETs with Various Interfacial Layer Processes by Charge Pumping Technique

碩士 === 國立清華大學 === 工程與系統科學系 === 101

Bibliographic Details
Main Authors: CHEN, SHENG-KAI, 陳聖楷
Other Authors: Chang-Liao, Kuei-Shu
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/92568006893996535988