Reliability Analysis of Three Dimensional Chip Stacking Electronic Packaging with Through Silicon Vias and Micro-bump Interconnects

碩士 === 國立清華大學 === 動力機械工程學系 === 101

Bibliographic Details
Main Author: 林聖淳
Other Authors: 陳文華
Format: Others
Language:zh-TW
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/61831818341958964899