Life Prediction of Multi-Layer Power Module Subjected to Thermal Cycling Test
碩士 === 國立清華大學 === 動力機械工程學系 === 101 === With regards to the multi-layer structure such as solar cell chip module and insulated gate bipolar transistor (IGBT) power module, it is an important issue to estimate its reliability effectively, and apply to the development of actual production. Compare...
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| Format: | Others |
| Language: | zh-TW |
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2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61736609914824894939 |