Performance Improvement of Small Delay Defects Testing using SSTA and False Path Detection
碩士 === 國立中山大學 === 資訊工程學系研究所 === 101 === Small Delay Defect (SDD) is one kind of the signal transition delay faults. It could not be detected via traditional delay testing method because the delay time is too small, however, the-se faults could cause timing failure in the circuit when the accumulatio...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/23291300066635317178 |