Study on the effects of copper process on the a-IGZO thin film transistor

碩士 === 國立交通大學 === 顯示科技研究所 === 101 === In this work, the influence of copper process on amorphous type Indium Gallium Zinc Oxide (a-IGZO) thin film transistor’s (TFTs) transfer curve is studied. By comparing the TFTs characteristics with Ti/Al/Ti source/ drain and Cu/Ti source/drain, we observed that...

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Bibliographic Details
Main Authors: Lee, Cheng-Min, 李承旻
Other Authors: Tai, Ya-Hsiang
Format: Others
Language:en_US
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/34242977530889650372